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GI20干涉儀
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- 更新時(shí)間：2016-04-19
產(chǎn)品簡(jiǎn)介：
The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm （6"）Ø.
The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6”)Ø. Unlike conventional fizeau interferometers, the GI20 can measure
non-reflective surfaces, ideal for analysing lapped and/or ground surfaces prior to final polishing. The interferogram is displayed on a LCD screen on the front of the unit.
• High precision flatness measurement of ground, lapped or semi-polished samples
• Measure 2μm per fringe with excellent clarity
• Surface roughness measurement from 1nm to 300nm Ra
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